APEX Software for EBSD

APEX™ EBSD enables the characterization of Electron Backscatter Diffraction (EBSD) patterns within the user-friendly APEX software platform. The combination of powerful pattern analysis and an intuitive interface, allows you to collect and report high-quality data quickly, easily, and reliably. Paired with EDAX hardware, APEX increases user productivity and offers the best solution for microstructural characterization.

Simultaneous EDS-EBSD collection in APEX™ EBSD.

Ease of Use

Intuitive operation for novice and expert users
Graphical ribbon bar enables quick access to features and functions
Analysis modes organized into application tabs with relevant functions arranged in logical groups in each tab
Smart functions for automatic optimization of data collection and reporting

Adjustable Layouts

Multiple layouts available for each application tab that show relevant view windows for desired operation
Ability to resize and arrange data view windows according to user requirements
Save and reuse custom layouts
Selectable color schemes to match the Scanning Electron Microscope (SEM) interface or user preferences
Compatible with multiple monitor configurations

User Customization

Single or multi-user modes
Option to use Windows® Authentication for login
Individual settings saved for each user

Features

Triplet Indexing resolves overlapping patterns for better indexing.

Triplet Indexing Engine

Minimize sensitivity to rogue band detection with the unique three-bands (triplets) indexing approach
Achieve high indexing success rates with Triplet Indexing, even at fast acquisition speeds of 4,500 indexed points per second with the Velocity™ Super EBSD camera
Patented Confidence Index value provides a quantitative quality measurement for the crystallographic indexing solution
Optimize band detection settings on the dedicated Hough page to allow for successful indexing of all crystal structures
Produce high-quality, indexing results on real-world samples

Comprehensive EBSD Data Collection

Easily collect individual EBSD patterns or a full scan
Multiple scan modes available
Hexagonal grid sampling for enhanced data sampling
Line scan acquisition
Smart step size recommendations for efficient scanning
Smart detector optimization allows you to set up EBSD acquisition per application requirements
Atom Probe Assist™ mode available for monitoring grain boundaries

Dynamic Scanning

Observe and assess data collection in real-time with visual and numeric feedback during each scan
Grayscale maps include Image Quality, SEM signal, and PRIAS (optional)
Color maps include IPF, Confidence Index, Phase, and EDS Elements
Combine grayscale and color maps to better understand results
Data statistics summary
EBSD pattern and indexing display
Crystal Unit Cell display
Hough band detection
Feedback provides users with information on collection quality

Montage Large Area Mapping

Scan large areas using stage movements to collect multiple fields of analysis
Automatically stitch data into a single file for comprehensive analysis
Oversampling available to improve matching between fields

EBSD ComboScan of a Gibeon Meteorite sample for large area analysis.

Batch Scanning

Collect a series of scans as a single batch process
Define standard free-form, Montage, and line scans within a batch
Define the magnification, scan area, step size, simultaneous EDS, and stage location within the batch
Enable efficient use of SEM for analyzing multiple areas or samples

Data Management

Project tree structure for seamless organization of data
64-bit software architecture for handling big data
HDF file format for data management and portability
Single file for both EDS and EBSD collection
Ability to specify file name and location to meet user needs
Default names within project tree for quick collection with option to rename if desired
HDF file compatible with APEX Review for EDS analysis and OIM Analysis™ for EBSD analysis

Integrated EDS-EBSD

Full integration of Energy Dispersive Spectroscopy (EDS) and EBSD for comprehensive materials characterization
Combine EDS spectrum with EBSD pattern collection for correlation of chemical and structural information
Utilize advanced EDS quant engine optimized for high-tilt EBSD geometries
Simultaneous EDS-EBSD scanning compatible with ChI-Scan processing for enhanced multi-phase analysis

Advanced Reporting

Customizable report generation based on OIM Analysis user templates
Tailored report layout with Report Designer tool
User-defined report content in template files with default design templates available
Generate reports from APEX EBSD or from OIM Analysis software
Use reporting with batch scanning capability