EDAX EDS Powered by Gatan
The most intuitive and easy-to-use analytical tool for (scanning) transmission electron microscope (STEM) applications

The EDAX EDS Powered by Gatan offers fully integrated data acquisition and signal processing, coupled with features to guide setup and analysis. The Elite T silicon drift detector maximizes collection efficiency and optimizes light element performance, while DigitalMicrograph® software is the industry standard for TEM/STEM experimental control and analysis across the range of imaging and analytical techniques. This powerful combination helps users achieve the best possible results in challenging conditions.


Elite T silicon drift detector

  • Compact sensor geometry gets you closer to the sample, maximizing the solid angle and increasing count rates for faster data collection on sensitive samples
  • Delivers outstanding resolution and minimal peak shift at all count rates for optimal deconvolution and high maximum count rate for fast mapping and time to data
  • Uses windowless design to provide excellent sensitivity for low energies down to Al L

DigitalMicrograph software

  • Full DigitalMicrograph integration provides a powerful, multi-dimensional, one-stop data analysis and visualization platform for all TEM/STEM applications
  • Allows you to customize your analysis with native support for DigitalMicrograph scripting and Python programming
  • Utilizes highly configurable data acquisition and a single palette to precisely control and simplify all acquisition workflow: areas, lines, points, and time series
  • Multimodal capability consolidates all STEM data on a single platform, including energy dispersive spectroscopy (EDS), electron energy loss spectroscopy (EELS), 4D STEM, cathodoluminescence (CL), and imaging

Contact Us