EM-Tec low profile pin stubs for FIB applications

Introduction

 

The low profile pin mounts have been especially developed for FIB/SEM applications to bring samples closely to the pole piece of the FIB/SEM systems to enable low working distances. They are available as flat, vertical and complementary tilt versions of the standard Ø12.7mm pin stub and a flat version of the larger Ø25.0mm pin stub. The complimentary tilt version allow positioning of the sample surface flat under the FIB column without the need to tilt the stage. The tilt angle is relative to the vertical electron beam column of the FIB/SEM systems. Made from vacuum grade aluminium and fully compatible with the standard pin stubs for storage and handling.

Available as the following types:

• low profile flat horizontal pin mount with standard or short pin
• low profile large flat horizontal pin mount with standard pin
• low profile 90° vertical pin mount with standard or short pin
• 38° complimentary angle pin mount for TFS / FEI DualBeam and FIB/SEM systems
• 36° complimentary angle pin mount for Zeiss CrossBeam and FIB/SEM systems
• 35° complimentary angle pin mount for Tescan FIBxSEM systems

Specifications of the low profile pin stubs