10-002238-EM-Tec P38 fixed 36-pre-tilt holder for FEI FIB systems
EM-Tec FIB pre-tilt holders for FEI, Zeiss and Tescan FIB/SEM systems

EM-Tec FIB pre-tilt stub holders

Introduction
EM-Tec P38 fixed 36°pre-tilt holder for FEI FIB systems, Ø12.7x17mm, pin

 

Pre-tilt stub holders are useful for FIB/SEM systems to get the sample perpendicular with the FIB column to allow for straight FIB milling in to the surface  of the sample. The pre-tilt angles are complementary to the angles between the FIB column and the electron beam column. When pre-tilt stub holders are used, there is no need to tilt the sample stage. Three types are available:

  • EM-Tec P38 fixed 38° tilt holder for FEI pin stubs. Used to pre-tilt samples 38° for TFS / FEI DualBeam FIB/SEM systems. Size w.o. pin is Ø12.7x17mm.
  • EM-Tec P36 fixed angle 36° tilt holder for Zeiss pin stubs. Used to pre-tilt samples 36° for Zeiss CrossBeam FIB/SEM systems. Size w.o. pin is Ø12.7x17mm
  • EM-Tec P35 fixed angle 35° tilt holder for standard and Tescan pin stubs. Used to pre-tilt samples 35° for Tescan FIBxSEM systems. Size w.o. pin is Ø12.7x17mm.

 

Specifications of the EM-Tec pre-til stub holders

 

Product #

Style

Angle

FIB/SEM

Capacity

Size w/o pin

Stub holding method

10-002238 P38 38° TFS / FEI Ø3.2mm pin Ø12.7x17mm Set screw
10-002236 P36 36° Zeiss Ø3.2mm pin Ø12.7x17mm Set screw
10-002235 P35 35° Tescan Ø3.2mm pin Ø12.7x17mm Set screw

 

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