![10-002238-EM-Tec P38 fixed 36-pre-tilt holder for FEI FIB systems](https://www.link-pakistan.com/wp-content/uploads/2022/08/10-002238-EM-Tec-P38-fixed-36-pre-tilt-holder-for-FEI-FIB-systems.jpg)
EM-Tec FIB pre-tilt stub holders
Introduction
![EM-Tec P38 fixed 36°pre-tilt holder for FEI FIB systems, Ø12.7x17mm, pin](https://www.microtonano.com/images/pages/10-002238-EM-Tec%20P38%20fixed%2036-pre-tilt%20holder%20for%20FEI%20FIB%20systems.png)
Pre-tilt stub holders are useful for FIB/SEM systems to get the sample perpendicular with the FIB column to allow for straight FIB milling in to the surface of the sample. The pre-tilt angles are complementary to the angles between the FIB column and the electron beam column. When pre-tilt stub holders are used, there is no need to tilt the sample stage. Three types are available:
- EM-Tec P38 fixed 38° tilt holder for FEI pin stubs. Used to pre-tilt samples 38° for TFS / FEI DualBeam FIB/SEM systems. Size w.o. pin is Ø12.7x17mm.
- EM-Tec P36 fixed angle 36° tilt holder for Zeiss pin stubs. Used to pre-tilt samples 36° for Zeiss CrossBeam FIB/SEM systems. Size w.o. pin is Ø12.7x17mm
- EM-Tec P35 fixed angle 35° tilt holder for standard and Tescan pin stubs. Used to pre-tilt samples 35° for Tescan FIBxSEM systems. Size w.o. pin is Ø12.7x17mm.
Specifications of the EM-Tec pre-til stub holders
Product # |
Style |
Angle |
FIB/SEM |
Capacity |
Size w/o pin |
Stub holding method |
10-002238 | P38 | 38° | TFS / FEI | Ø3.2mm pin | Ø12.7x17mm | Set screw |
10-002236 | P36 | 36° | Zeiss | Ø3.2mm pin | Ø12.7x17mm | Set screw |
10-002235 | P35 | 35° | Tescan | Ø3.2mm pin | Ø12.7x17mm | Set screw |