10-005150 JEOL 50x10mm cylinder SEM sample stub aluminium-small
SEM Scanning Electron Microscope Sample Stubs

SEM Sample Stubs


The SEM samples stubs are compatible with the respective brands of SEM for which they have been designed. We offer SEM sample stubs for all leading brands of SEMs. Each of the type of SEM sample stubs has a wide selection of platform size to accommodate different sample sizes and is available with 45°, 45/90° and even double 90° pre-tilt, there are four major types of SEM sample stubs:

    • Standard pin stubs with 3.15mm diameter and either 8 or 9.5mm pin length for TFS, FEI, Philips, Tescan, Phenom, AmRay, Cambridge Instruments, Leica, CamScan, Aspex, RJLee, Etec and Novascan SEMs
    • Short pin Zeiss stubs with 3.15mm diameter and 6mm length for Zeiss and LEO SEMs
    • JEOL cylinder stubs for JEOL SEMs
    • Hitachi M4 cylinder stubs with an M4 threaded hole in the base

Dish Type SEM sample stubs for working in Solutions or fluids


To prepare solution or fluids directly on the SEM stub there are dish type SEM sample stubs.

    • Standard pins stub SEMs such as FEI, Tescan, Phenom, etc
    • JEOL SEMs
    • Hitachi SEMs

Less Common Brands or on Special SEM Stages


There is also a selection of specialty SEM sample stubs which are used in less common brands or on special SEM stages. Examples are:

    • ISI/ABT/Topcon cylinder stubs
    • Hitachi In Lens Stubs
    • Hitachi pin stubs with M6 thread
    • Gatan 3View pin stubs
    • TFS/FEI VolumeScope pin stubs


SEM sample stub adapters for use across different SEM platforms

If you wish to use one type of SEM sample stub across different SEM platforms, you have to use an SEM sample stub adapter.

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